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太陽能(neng)電(dian)(dian)池(chi)在(zai)生(sheng)產(chan)過(guo)程(cheng)中外觀上會產(chan)生(sheng)各種污點、節點等(deng)缺(que)陷，嚴(yan)重影響產(chan)品質量和(he)企業形象(xiang)。太陽能(neng)電(dian)(dian)池(chi)測(ce)試(shi)的(de)(de)方法(fa)基于先進(jin)的(de)(de)機器視覺技術(shu)，結(jie)合太陽能(neng)電(dian)(dian)池(chi)表面(mian)(mian)印(yin)刷(shua)特(te)性。采(cai)用(yong)正面(mian)(mian)照射和(he)反面(mian)(mian)透(tou)射相結(jie)合的(de)(de)方式。可進(jin)行高速、準確的(de)(de)表面(mian)(mian)缺(que)陷在(zai)線檢(jian)(jian)測(ce)，并結(jie)合現場工(gong)藝在(zai)線報警(jing)。下面(mian)(mian)小編將詳細(xi)介紹PL檢(jian)(jian)測(ce)方案的(de)(de)詳細(xi)步驟：一、太陽能(neng)電(dian)(dian)池(chi)制程(cheng)及其檢(jian)(jian)測(ce)：硅片(pian)(pian)→清洗→擴散→刻蝕→PECVD→絲網印(yin)刷(shua)→燒結(jie)→測(ce)試(shi)分(fen)選(xuan)→EL檢(jian)(jian)測(ce)1、光伏硅片(pian)(pian)環(huan)節大型化，薄(bo)片(pian)(pian)化趨勢(shi)明確，電(dian)(dian)池(chi)片(pian)(pian)生(sheng)產(chan)加工(gong)過(guo)程(cheng)中更加容易(yi)產(chan)生(sheng)碎片(pian)(pian)和(he)隱裂。而E...

高質量的鈣鈦礦電池測試系統須滿足哪些要求？

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了解太陽光模擬器的操作規范

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